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Optics Experiment Apparatus
LEOI-18 Fabry-Perot Interferometer
LEOI-20 Michelson Interferometer
LEOI-21 Michelson & F-P Interferometer
LEOI-22 Precision Interferometer
LEOI-24 Measurement of Speed of Light
LEOI-26 Electronic Speckle Interferometry
LEOI-26A Laser Speckle Photography
LEOI-26B Electronic & Laser Speckle
LEOI-27 Fringe Projection Profilometry
LEOI-30 Diffraction Intensity
LEOI-30A Automatic Diffraction Intensity
LEOI-31 Single-Wire/Single-Slit Diffraction
LEOI-32 Crystal Magneto-Optic Effect
LEOI-33 Crystal Acousto-Optic Effect
LEOI-34 Crystal Electro-Optic Modulation
LEOI-35 Liquid Crystal Electro-Optic Effect
LEOI-36 Silicon Photocell Characterization
LEOI-38 PZT Characterization
LEOI-40 Polarized Light Experiments
LEOI-40A Polarized Light Experiments
LEOI-41 Effect of Optical Activity
LEOI-44 Ellipsometer
LEOI-45 Optical Transfer Function
LEOI-46 Cont. Optical Transfer Function
LEOI-47 Joint Fourier Transform
LEOI-50 Semiconductor Laser Pumping
LEOI-51 He-Ne Laser Mode Analyzer
LEOI-53 He-Ne Laser Serial Experiments
LEOI-58 Semiconductor Laser Experiment
LEOI-63 Blackbody Experiment
LEOI-70 Colorimetry Experiment
 
 
Fraunhofer Diffraction of a Single Slit
Fraunhofer diffraction of a single slit
 
      
LEOI-31

Single-Wire/Single-Slit Diffraction

        
Single-Wire/Single-Slit Diffraction
     
 
Features
Observe single-wire/single-slit diffraction 
Measure intensity distribution of diffraction   
Confirm relationship between intensity and wavelength   
Obtain relationship between intensity and slit width 
Verify Heisenberg uncertainty principle and Babinet's principle   
          
Introduction

LEOI-31 employs a movable digital photoreceiver to measure the intensity distribution of optical diffraction. With a focus adjustable semiconductor laser, this system can be used to

 

1. observe single-wire/single-slit diffraction

2. measure intensity distribution of optical diffraction

3. confirm the relationship between intensity and wavelength

4. obtain the relationship between intensity and slit width

5. verify Heisenberg uncertainty and Babinet's principles

 
Specifications

Semiconductor Laser   

5 mW @ 650 nm

Diffractive Element

Wire, and Single Slit (adjustable width)

 
Part List   

Description

Qty

Semiconductor Laser (LLL-1)

 1

Optical Rail (LEPO-54)

 1

Carrier

 2

White Screen (LEPO-14)

 1

Single-Slit with Adjustable Width (LEPO-42)

 1

Two-Axis Adjustable Laser Holder (LEPO-20)

 1

Photoreceiver with Amplifier

 1 each

Transverse Measurement Holder

 1

 
 
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