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Optics Experiment Apparatus
LEOI-18 Fabry-Perot Interferometer
LEOI-20 Michelson Interferometer
LEOI-21 Michelson & F-P Interferometer
LEOI-22 Precision Interferometer
LEOI-24 Measurement of Speed of Light
LEOI-26 Electronic Speckle Interferometry
LEOI-26A Laser Speckle Photography
LEOI-26B Electronic & Laser Speckle
LEOI-27 Fringe Projection Profilometry
LEOI-30 Diffraction Intensity
LEOI-30A Automatic Diffraction Intensity
LEOI-31 Single-Wire/Single-Slit Diffraction
LEOI-32 Crystal Magneto-Optic Effect
LEOI-33 Crystal Acousto-Optic Effect
LEOI-34 Crystal Electro-Optic Modulation
LEOI-35 Liquid Crystal Electro-Optic Effect
LEOI-36 Silicon Photocell Characterization
LEOI-38 PZT Characterization
LEOI-40 Polarized Light Experiments
LEOI-40A Polarized Light Experiments
LEOI-41 Effect of Optical Activity
LEOI-44 Ellipsometer
LEOI-45 Optical Transfer Function
LEOI-46 Cont. Optical Transfer Function
LEOI-47 Joint Fourier Transform
LEOI-50 Semiconductor Laser Pumping
LEOI-51 He-Ne Laser Mode Analyzer
LEOI-53 He-Ne Laser Serial Experiments
LEOI-58 Semiconductor Laser Experiment
LEOI-63 Blackbody Experiment
LEOI-70 Colorimetry Experiment
 
Schematic of System
1. He-Ne laser 6. Object under test
2. Plane mirror 7. Imaging lens
3. Beam expander 8. B/W camera
4. Plane mirror 9. Computer
5. Beam splitter  
 
      
LEOI-26

Electronic Speckle Pattern Interferometry Experimental System

     
Electronic Speckle Pattern Interference
    
 
Features    
Including He-Ne Laser and CCD Camera with Power Supplies
Open Configuration
High Accuracy and High Sensitivity     
Real-Time Display     
          
Introduction    

Electronic speckle pattern interference (ESPI) experimental system makes use of speckle, which is the carrier of rough surface information, to study a substance. It is a modern optical measuring technique that covers image processing, laser technology, and holographic interference techniques. Thanks to the splendid coherence of lasers, the speckle is so obvious that it can be easily and clearly taken by a CCD camera, and then the data and image attained can be processed by a computer.

 
Specification

He-Ne Laser

1.5 mW @632.8 nm

Voltage Variable Supply

0 V to 110 V

B/W CCD Camera

752 (H) x 582 (V) pixels

Image Card

640 x 480 x 16 bit

Measurement Error

λ/2 @632.8 nm

 
Part List     
Description

Qty

He-Ne Laser with Power Supply (LLL-2)

1

Magnetic Base with Post Holder (LEPO-4)

8

2-D Adjustable Stage (LEPO-2)

1

Kinematic Platform Clamp (LEPO-12)

1

Kinematic Mount (LEPO-8)

4

Plate Holder (LEPO-13)

2

Laser Tube Holder (LEPO-44)

1

White Screen (LEPO-14)

1

Plane Mirror

3

Beam Expander (f = 4.5 mm)

1

Beam Splitter (6:4, 60x50x6.3 mm)

1

Lens (f = 70 mm)

1

Tested Object 1 with Power Supply

1

Tested Object 2

1

B/W CCD with Power Supply

1

Image Card

1

Application Program and Manual

1

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Speckle Image of Sample Processed Speckle Image of Sample Binarization Processing of Image Surface Contour of a Sample Object
Speckle image of a sample object
Processed speckle image
Binarization processing of image
Surface contour of a sample object