Lambda Scientific Systems, Inc

14055 SW 142^nd Ave, Suite 22

Miami, FL 33186, USA

Tel: 305-252-3838

Fax:305-517-3739

Email: sales@lambdasys.com

Experimental Instruments

View our range of experimental instruments/systems that are specially designed to promote experimental teaching and learning with modular and open structures, covering interferometers, diffraction and polarization based instruments, laser mode analyzers, spectrometers, colorimeter, characterizing instruments for electro-optic, acousto-optic and magneto-optic effects. Also we have instruments for verifying constants such as black body irradiation, thermal expansion coefficient, etc. All instruments come with self-paced and comprehensive experimental instructions/manuals.

Electronic speckle pattern interferometry (ESPI) is a method for studying object surface deformation. It involves image processing and holographic interferometry. This experimental system helps students gain knowledge of the principle and applications of ESPI.

This experimental system is designed to help understand the phenomenon and characteristic of laser speckle. Point-to-point and global analysis of the surface displacement of an object can be conducted from its double-exposed speckle graph.

This experimental unit combines laser speckle photography and electronic speckle interferometry to measure the surface displacement field of an object from its double-exposed speckle graph. It can also measure strain, stress field, displacement, velocity, internal defect, and vibration of sample materials.

This system is designed to demonstrate Moire profilometry as a noncontact 3-D shape measurement technique. Through this system, users can understand the principle and operation of 3-D shape measurement based on fringe projection technique.

This system is designed to observe single-wire/single-slit diffraction, measure intensity distribution of diffraction, verify the relationships between intensity and wavelength/slit width, and acknowledge Heisenberg uncertainty and Babinet's principles. 

This apparatus is designed to help students to understand the principle and application of liquid crystal electro-optic effect. Through this system, students can measure LC response curve, threshold & saturation voltages, and transmittance.

This system is designed to study the piezoelectric characteristics of a PZT. Through this system, students can acknowledge the characteristics of a PZT, and familiarize with the measurement technique of micro displacement through a Michelson interferometer.

Optical polarization related experiments such as polarization generation by reflection, refraction, and dichroism can be conducted manually using this unit. Verification of the Malus's law and measurement of Brewster's angle can also be performed.

This unit is designed to characterize the optical activity of an optically active material, and measure the relationship between specific rotation and concentration of glucose solutions.

Through this system, users can understand the basic principle of Fourier image recognition, familiarize with the construction of a Fourier image recognizing system, and expand the system for more advanced research applications.

This system is designed to measure the output power of a semiconductor laser as well as the driving voltage and injection current of the laser. It can help students understand the working characteristics of a semiconductor laser under CW output mode.

This system is designed to automatically record the radiation spectrum of an emission light source. By varying the color temperature of the light source, the phenomenon described by Wien's displacement law can be observed through the recorded radiation spectrum of the light source.

This unit is designed for colorimetric education at college and university level and it is an experimental system with a high performance-to-cost ratio. LEOI-70 is the basic model and LEOI-70A is the enhancement model.